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A BSOD for All Seasons – Send Bad News via a Kernel Panic

https://bsod-fas.pages.dev/
1•keepamovin•3m ago•0 comments

Show HN: I got tired of copy-pasting between Claude windows, so I built Orcha

https://orcha.nl
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Omarchy First Impressions

https://brianlovin.com/writing/omarchy-first-impressions-CEEstJk
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Reinforcement Learning from Human Feedback

https://arxiv.org/abs/2504.12501
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Show HN: Versor – The "Unbending" Paradigm for Geometric Deep Learning

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1•panossk•13m ago•0 comments

Big Tech vs. OpenClaw

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1•headalgorithm•15m ago•0 comments

Anofox Forecast

https://anofox.com/docs/forecast/
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Ask HN: How do you figure out where data lives across 100 microservices?

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Motus: A Unified Latent Action World Model

https://arxiv.org/abs/2512.13030
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Rotten Tomatoes Desperately Claims 'Impossible' Rating for 'Melania' Is Real

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3•juujian•18m ago•2 comments

The protein denitrosylase SCoR2 regulates lipogenesis and fat storage [pdf]

https://www.science.org/doi/10.1126/scisignal.adv0660
1•thunderbong•19m ago•0 comments

Los Alamos Primer

https://blog.szczepan.org/blog/los-alamos-primer/
1•alkyon•22m ago•0 comments

NewASM Virtual Machine

https://github.com/bracesoftware/newasm
2•DEntisT_•24m ago•0 comments

Terminal-Bench 2.0 Leaderboard

https://www.tbench.ai/leaderboard/terminal-bench/2.0
2•tosh•24m ago•0 comments

I vibe coded a BBS bank with a real working ledger

https://mini-ledger.exe.xyz/
1•simonvc•25m ago•1 comments

The Path to Mojo 1.0

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Show HN: I'm 75, building an OSS Virtual Protest Protocol for digital activism

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Show HN: I built Divvy to split restaurant bills from a photo

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3•pieterdy•33m ago•0 comments

Hot Reloading in Rust? Subsecond and Dioxus to the Rescue

https://codethoughts.io/posts/2026-02-07-rust-hot-reloading/
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Skim – vibe review your PRs

https://github.com/Haizzz/skim
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Show HN: Open-source AI assistant for interview reasoning

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4•Nive11•35m ago•6 comments

Tech Edge: A Living Playbook for America's Technology Long Game

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Golden Cross vs. Death Cross: Crypto Trading Guide

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3•chartscout•42m ago•1 comments

Hoot: Scheme on WebAssembly

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What the longevity experts don't tell you

https://machielreyneke.com/blog/longevity-lessons/
2•machielrey•46m ago•1 comments

Monzo wrongly denied refunds to fraud and scam victims

https://www.theguardian.com/money/2026/feb/07/monzo-natwest-hsbc-refunds-fraud-scam-fos-ombudsman
3•tablets•50m ago•1 comments

They were drawn to Korea with dreams of K-pop stardom – but then let down

https://www.bbc.com/news/articles/cvgnq9rwyqno
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Show HN: AI-Powered Merchant Intelligence

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Bash parallel tasks and error handling

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2•pastage•55m ago•0 comments
Open in hackernews

Disrupting the DRAM roadmap with capacitor-less IGZO-DRAM technology

https://www.imec-int.com/en/articles/disrupting-dram-roadmap-capacitor-less-igzo-dram-technology
50•ksec•5mo ago

Comments

ksec•5mo ago
I have been banging on about DRAM doesn't scale for a long time. And this is the first time we have something that fundamentally changes DRAM.

We could have higher capacity, faster and most importantly far more energy efficient DRAM.

Kikawala•5mo ago
> Through the years, imec has made considerable progress in assessing, understanding, and modeling reliability failure, paving the way to building reliable IGZO transistors with a target lifetime of five years

Replacing your DRAM sticks every five years may be okay, but what about for boards with soldered on memory?

IlikeKitties•5mo ago
If a Single Cell has a lifetime of 5 years (of hopefully constant r/w cycles) than with a few reserve cells and a controller like an ssd you could propably get decades of lifetime on a stick.
russdill•5mo ago
That isn't the impression I get. It's not a wear issue so much as a natural degregation of the materials. It's something that is being worked on for the technology to be viable.
crote•5mo ago
Their graphs show it as being voltage-dependent, so there's definitely some wear component involved.
russdill•4mo ago
It looks like the wear is related to holding a positive voltage on the gate. So just the act of storing information
perching_aix•5mo ago
Video coverage of this story by Ian Cutress: https://youtu.be/ITdkH7PCu74

(you may need to adjust the volume, the audio is 5 LU below reference)

zparky•5mo ago
Oh hey, that's Dr. Ian Cuttress - I loved reading his pieces on anandtech. I wondered what he'd been up to, thanks for sharing!
juancn•5mo ago
Some people are even considering this as a possibly viable path to compute on memory.

For example: https://www.science.org/doi/10.1126/sciadv.adu4323

deepnotderp•5mo ago
10^11 cycles is not “practically unlimited endurance”, that’s less than a second of use at 1 GHz
deckar01•5mo ago
> >10^3s retention, >10^11 cycles endurance

The implication is that it can theoretically hold a value for 10^14s (~3 million years).

crote•5mo ago
Yes, but most memory workloads don't store the same value for 15+ minutes at a time. And if you're using it as long-term storage (so basically a flash alternative) that 15-minute retention time is awfully low.
deckar01•4mo ago
Decades of research into optimizing DRAM refresh efficiency suggests that you don’t understand how the world is using DRAM.
adgjlsfhk1•5mo ago
You can't use a single cell of RAM at GHz frequencies. By the time you read a value and write another value back, you're talking about ~200ns so you are capped at ~5mhz writes (and anything that you are actually trying to access that quickly will be in caches anyway so your writes won't make it out to the DRAM unless you explicitly flush the caches)
nomel•5mo ago
200ns seems a bit high. But, if you do the math, you'll find that's a practically negligible difference, at only 6 hours at 5MHz.

DRAM appears to be closer to 300 hours, at reasonable temperatures [1], at the worst case workload.

It would be interesting if Google released their failure rates, like they did with hard disk vs ssd.

[1] modeled failures, page 75: https://repository.tudelft.nl/record/uuid:e36c2de7-a8d3-4dfa...

ahartmetz•5mo ago
>DRAM appears to be closer to 300 hours

Yikes! Things that you don't necessarily want to know. Another one is that GPUs are released crawling with bugs - only the ones without cheap driver workarounds are fixed.

crote•5mo ago
Skimming through the linked paper, I can't actually find that claim being backed up anywhere?

The abstract does indeed say "It was found that the system reliability decreases to 0.84 after 1·10^8s at a stressing temperature of 300K", but I can't find anything close to that in the sections about Bias Temperature Instability or Hot Carrier Injection.

The only thing which to me looks close is the rather acute failure in the Radiation Trapping section - but that also states that the failure mode is dependent more on the total dose than time, and the total dose at which it fails is somewhere between 126 krad - 1.26 Mrad. For reference, a dose of 1 krad is universally fatal to a human.

In other words: don't put unshielded DRAM in a nuclear reactor?

nomel•4mo ago
I included the page number with the link, to prevent this, and also noted that these were modeled failures. I had trouble finding any real world data, which is where the google comment came in.
deepnotderp•5mo ago
Sure, but conventional DRAM endurance is 10^15 or more
pjdesno•5mo ago
Note that this is very early work - one of the papers (the HUST one from this June) shows an 8x8 cell device, i.e. 64 bits in SLC mode.

DRAM kind of plateaued in 2011, when it hit $4/GB; since then it's gotten faster and bigger, but not appreciably cheaper per bit.

This could change if there was a way to do 3D DRAM, like 3D NAND flash, but that doesn't appear to be on the table at present. Note that this isn't the "stacking" they talk about with IGZO-DRAM, where they build layers on top of each other - it's not 3D stacking itself that made flash cheap.

Flash got insanely cheap because of the single-pass 3D architecture - it's pretty cheap to put a large number (~400 nowadays) of featureless layers onto a chip, then you drill precise holes through all the layers and coat the inside of the hole with the right stuff, turning each hole into a stack of ~400 flash cells.

The cost of a wafer (and thus a chip) is proportional to the time it spends in the ultra-expensive part of the fab. 3D NAND puts maybe 100x as many cells onto a wafer as the old planar flash (you can't pack those holes as closely as the old cells), but what's important is that the wafer only spends maybe 2x as long (I'm totally guessing here) in the fab. If it took 100x as long, laying down a few hundred layers, the price advantage would vanish.

Veliladon•5mo ago
They can do it with 3D NAND because the electrons are injected into the charge storage medium through brute force. The problem is that the capacitance scales with area. We're reducing the node size but now the aspect ratios are insane and the trenches for the storage wells are >3um high. That's over 1,000 times thicker per layer compared to NAND.
adgjlsfhk1•5mo ago
3D ram stacking still would have significant benefits since the amount of board space taken up by RAM is significant. Quadrupling capacity per area would be a game-changer for GPUs with HBM, and could allow for a CAMM like standard to make it's way into servers.
phkahler•5mo ago
>> Through the years, imec has made considerable progress in assessing, understanding, and modeling reliability failure, paving the way to building reliable IGZO transistors with a target lifetime of five years

Five year lifetime isn't getting anywhere near my setup. Also notably absent was anything about read or write times. It sounded promising all the way up to that last paragraph.

adgjlsfhk1•5mo ago
The read and write times are apparently in the ~10ns range which is within the allowable range for DRAM (you'll have another 50-100 from the connectivity anyway)
yvdriess•5mo ago
It would be a waste to use this to just make DIMMs. It's only transistors, like SRAM cells, so you can efficiently fab them on the same process technology and the same dies as your logic.

Then again, there is wear, so either you accept a level of performance degeneration (dynamic capacity cache?) or you go to DIMMs anyway servicability.

burnte•5mo ago
Agreed, but remember how bad flash memory was in the early SSD days.
mrheosuper•5mo ago
I've watched a video about this DRAM tech, looklike the write cycle lifetime is acceptable for typical usecase
Dylan16807•5mo ago
https://www.imec-int.com/en/articles/capacitor-less-igzo-bas...

The graph on this page is awful, but those endurance lines on the right side are going up toward a century at optimal temperature.

I think we'll have to wait and see.

johnklos•5mo ago
> paving the way to building reliable IGZO transistors with a target lifetime of five years

It almost makes it seem like they want their memory to last five years, as though it's a feature.

drpixie•5mo ago
Each cell has 2 transistors and a length of trace. Why not use the 2 transistors as a flip-flop? Then there is no charge decay.

Thinking in the same vein - transistors are really small now. Aren't we at the stage where we can drop DRAM and replace transistor+capacitor with 2 transistors as a flip-flop? It would save all that refresh time and controller circuitry.

Kubuxu•5mo ago
Traditional CMOS D-flipflop takes 16 transistors, SRAM cell takes 6 (two looped inverters and two data-line selection transistors).

The capacitor in DRAM is usually realised as an enlarged gate of a transistor AFAIK.

adrian_b•4mo ago
You cannot make an RS latch with 2 transistors, much less a flip-flop, which is at least 50% more complex than a latch (a flip-flop differs from a latch because its state changes only on clock transitions; this is not needed for a memory, so memories use only the simpler latches).

You can make a latch with 2 transistors and 2 resistors, but resistors are more expensive than transistors in an integrated circuit, so the minimal latch has 4 transistors.

However with simple latches you cannot build a memory, because there must be a way to address them. Therefore you must add 2 pass transistors for cell addressing, thus you end with a 6-transistor SRAM cell. In the past there have been some SRAMs with so-called 4-transistor cells, but that is a misnomer, because those were 6-transistor cells where 2 transistors were passive, having their gates connected permanently to fixed potentials, making the transistors a substitute for resistors.

A 6-T SRAM cell has a few not-so-good characteristics, so for maximum performance, like in the first-level cache memory, more complex 8-transistor SRAM cells are used.

Even the simplest SRAM cell is much more complex than a DRAM cell, flash memory cell or ROM cell.

The ideal memory cell has the area of a square whose side is double the resolution of the available photolithography, because any cell must be at the intersection of a row and a column, where the row and the column must contain at least one conductor trace.

By 3-dimensional stacking of the memory cell components, some variants of DRAM cells, including the cell from TFA, may reach the ideal memory cell size.

adrian_b•4mo ago
It should be noted that the claim that the new DRAM cell has no capacitor can be misleading.

Like any DRAM cell, it has a capacitor, which in this case is the gate capacitor of a MOS transistor.

The separate capacitor of current DRAM cells is replaced by a second transistor, whose gate capacitor stores the charge that distinguishes stored "1"s from stored "0"s. Such 2-transistor cells, where the second transistor used for sensing the cell state also includes the capacitor, are not new, they had been used in many early DRAM devices, decades ago.

The main advantage of the new cell is in replacing silicon for the transistors of the DRAM cell with another semiconductor material with wider bandgap than silicon.

This reduces a lot the leakage currents, allowing a smaller capacitor. The gate capacitor of the storage transistor is sufficient, so no other separate capacitor is needed.

One thing that is not mentioned is how resistant are the new DRAM cells to radiation. The smaller stored charge makes them more susceptible, but the wider bandgap of the transistors makes them less susceptible, so it is uncertain which is the actual behavior.